منابع مشابه
An Improved Microscope Lamp.
The new inclined binocular microscopes when used with high-power objectives require much light to illuminate adequately the field of view. At least three times the light is necessary as for a similar optical combination on a monocular instrument. The ordinary opal bulbs even when over-run do not provide sufficient illumination, and of course with them there is no possibility of employing a ligh...
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Photographic presentat ion of l ight microscope rad ioautograms is difficult since the silver grains and the sections lie in two different planes. At the h igh magnificat ions necessary for m a x i m u m resolution of fine grain emulsions, it is impossible to get bo th the grains and the section in focus. This causes little difficulty under the microscope since one can focus at will on each pla...
متن کاملMicroscope Volume Segmentation Improved through Non-Linear Restoration
An efficient segmentation technique based on the use of a modified k-Means algorithm and the Otsu’s thresholding method is improved through a non-linear restoration of microscope volumes. An algorithm is proposed to automatically compute the k value for the clustering k-Means method. The unsupervised algorithm is used in the context of segmentation by considering regions as clusters. A comparis...
متن کاملImproved sectioning in a slit scanning confocal microscope.
We describe a simple implementation of a slit scanning confocal microscope to obtain an axial resolution better than that of a point-scanning confocal microscope. Under slit illumination, images of a fluorescent object are captured using an array detector instead of a line detector so that out-of-focus light is recorded and then subtracted from the adjacent images. Axial resolution after backgr...
متن کاملImproved atomic force microscope cantilever performance by ion beam modification
The performance of atomic force microscopy cantilevers, as measured by the resonant frequency and spring constant, is directly dependent on the shape of the cantilever. Here we have improved the performance of conventional silicon nitride cantilevers by using focused ion beam milling to minimize the width of the cantilever legs. The resonant frequency in solution for any given spring constant i...
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ژورنال
عنوان ژورنال: Scientific American
سال: 1880
ISSN: 0036-8733
DOI: 10.1038/scientificamerican08281880-3869bsupp